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62774953
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
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товар №:
62774953
€ 174
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This book enlightens readers on the basic surface properties and distance-dependent intersurface forces to obtain even simple data from an atomic force microscope (AFM).
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Информация о продукте
| Publisher | Wiley |
| Publication date | September 24, 2012 |
| Edition | 1st |
| Language | English |
| Print length | 496 pages |
| ISBN-10 | 0470638826 |
| ISBN-13 | 978-0470638828 |
| Item Weight | 1.87 pounds (850 grams) |
| Dimensions | 6.42 x 1.22 x 9.6 inches (16.3 x 3.1 x 24.4 cm) |
ОПИСАНИЕ ТОВАРА
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications
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Microscopes & Microsocopy Editorial Review
Atomic Force Microscopy: Understanding Basic Modes and Advanced Applications offers an in-depth exploration of AFM technologies, published by Wiley in September 2012. This comprehensive guide spans 496 pages and serves as an essential resource for understanding both the fundamental modes and advanced applications of atomic force microscopy. The well-structured content and clear illustrations cater to both beginners and advanced practitioners in the field, making it an invaluable addition to one's library. Readers appreciate the extensive detail presented, supporting their comprehension of complex AFM concepts.
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Плюсы
- Comprehensive coverage of AFM techniques
- Clear illustrations enhance understanding
- Suitable for beginners and experts
- Well-structured and informative content
- Published by a reputable publisher
Минусы
- Might be too detailed for casual readers
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€ 174
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Особенности и преимущества
- Comprehensive guide on atomic force microscopy (AFM).
- Explains basic surface properties and intersurface forces.
- Details on calibration and artifacts provided.
- Covers signal/noise limitations for better data accuracy.
- Includes imaging and materials property characterization.
- Discusses advanced topics like tribology and electromagnetic interactions.
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